Proceeding of

NCAICN National Conference 2013

(NCAICN-2013)

on

Advances in

Computing & Networking

as

A Special Issue of

International Journal of Computer Science and Applications

(ISSN:0974-1011)

Patron

Hon. Shri Sundeepji Meghe

(Chairman, Vidarbha Youth Welfare Society, Amravati)

 

Advisor

Dr. V.T. Ingole (FIE, FIETE, Professor Emeritus)

 

Organizing Committee

Chairman

Dr. D.T. Ingole (FIE, FIETE)

(Principal PRMIT & R, Badnera and  Chairman IEI  Amravati Center).

Secretary

 Er. A.W. Jawanjal

(Honorary Secretary IEI, Amravati Center)

Conveners

Dr. G.R. Bamnote ((FIE, FIETE)

(H.O.D. Computer Science & Engineering)

Dr. A.S. Alvi (MIE)

(H.O.D. Information Technology))

Prof. Mrs. M.D. Ingole (FIE.MIETE)

(H.O.D. Electronics & Telecommunication)

Coordinators

Prof. S.V. Dhopte ((FIE, FIETE)

Prof. Ms. V.M. Deshmukh (FIE, FIETE)

Dr. S.W. Mohod  (FIE,FIETE)

Co-Coordinators

Dr. S.R. Gupta (MIE, MIETE)

Prof. S.V. Pattalwar ((FIE, FIETE)

Prof. M.D. Damahe

Members

Prof. Mrs. M.S. Joshi                

Dr. S.M. Deshmukh

Prof. V.U. Kale

Prof. S.S. Kulkarni

Prof. Ms. R.R. Tuteja

Prof. Ms. J.N. Ingole

Prof. V.R. Raut

Prof. C.N. Deshmukh

Prof. Ms. M.S. Deshmukh

Prof. S.P. Akarte

Prof. Mrs. A.P. Deshmukh

Prof. Mrs. S.S. Sikchi

Prof. N.N. Khalsa

Department of Information and Computer Science and Engineering

Prof. Ram Meghe Institute of Technology and Research, Badnera Distt. Amravati

 

Editor

Prof. K. H. Walse

M.S.India

 

 

 

   
   
   
   
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
IJCSA ISSN: 0974-1011 (Online) >>    
Title:

Intelís 45nm CMOS TECHONOLOGY PERFORMANCE PARAMETERS IN VLSI DESIGN

Author:
Mr. Dharmik N.Mehta, Mr. Pankaj N.Sanghavi and Dr.U. A. Belorkar
 

Abstract

In this paper we describe Intelís 45nm technology performance parameters and relate it with a other technology. Firstly, we give an overview of the evolution of important parameters such as the integrated circuit (IC) complexity, gate length, switching delay and supply voltage with a prospective vision down to the 22 nm CMOS technology.



©2013 International Journal of Computer Science and Applications 

Published by Research Publications, India